Tag Archives: Carl Zeiss

3D Laser Scanning Can Create Value in Metrology

If you’re looking for more data in less time, 3D laser scanning may be a good choice for your metrology application. From an article on www.qualitymag.com Consider a CMM. If you need to get information for 100 measurements, that takes … Continue reading

Posted in 3D Modeling, Data, Hardware, Inspection, Laser Scanning, Metrology, point clouds, reverse engineering, Sensors | Tagged , | Leave a comment